Atomic Force Microscope (AFM)

Also called Scanning Force Microscope (SFM) . Microscopy technique developed in 1986 by Gerd Binnig et al. which – in an ideal case – allows small structures down to 0.1 nm to be resolved, which means that atomic and molecular structures can be resolved. The measuring principle is based on the measurement of the movement of a nano-range thin needle guided over the surface.

Continue reading at: Scanning electron Microscope (REM)