Atomic Force Microscope (AFM)

 also designated "Scanning Force Microscope (SFM)"

Developped in 1986 by Gerd Binnig et al.

The principle is the measurement (usually by laser scanning) of the movement of a nano-scale needle.

The principle enables to separate structures of minimum 0,1 nm distance under optimal conditions what enables the visualization of single atoms and molecules.

Femto TEM
Special Plasma Installation for Preparation of transperency samples for Transmission Electron Microscopy