TOF-SIMS

Acronym for Time of Flight Secondary Ion Mass Spectrometry, surface analysis method in which the surface is bombarded with a pulsed ion beam. From the time-of-flight of the ejected secondary ions, their mass and thus element can be accurately determined.

back to glossary

+49 7458 99931-0

Get an expert on the phone

info@plasma.com

Write us what we can do for you

Request a quotation

You know exactly what you’re looking for